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تقنية الاختبار الذاتي المدمجة لمصفوفة من التشكيل النانوي لنظام على رقاقة == A Built-In Self-Test Technique for Nano System on Chip Array Configuration

Author name: لؤي مهدي كاظم حسن
Supervisor name: قيس كريم عمران
General topic: Electrical, Electronic and Communications Engineering
Specific topic: Electronic Engineering
Degree: Master
University: University of Babylon - College Of Engineering - Department Of Electrical Engineering
Language: English
University location: Babylon
First pages: T90382 - p.pdf
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