تقنية الاختبار الذاتي المدمجة لمصفوفة من التشكيل النانوي لنظام على رقاقة == A Built-In Self-Test Technique for Nano System on Chip Array Configuration
Author name:
لؤي مهدي كاظم حسن
Supervisor name:
قيس كريم عمران
General topic:
Electrical, Electronic and Communications Engineering
Specific topic:
Electronic Engineering
Degree:
Master
University:
University of Babylon - College Of Engineering - Department Of Electrical Engineering
Language:
English
University location:
Babylon
First pages:
T90382 - p.pdf
